LTFN is a world-class pioneer in Optical Technology and Nanometrology that develops in-situ, in-line and ex-situ Optical Metrology techniques and methodologies for nanomaterials, systems characterization and process optimization.
Its state-of-the-art Nanometrology facilities include:
- Spectroscopic Ellipsometry (IR-NIR-Vis-farUV, ex-situ, in-situ, in-line)
- Raman & Photoluminescence
- Solar Simulators (from lab to large scale)
- X-rays Measurements (XRR, XRD, XDS)
- Scanning near-field microscopy (SNOM)
- Electrical Characterization
- SPM & Nanomechanical Characterization Platforms
- Luminescence & Photoluminescence
- Water Vapour Transmission measurements
- Contact angle measurements
- XPS, AES, TEM, SEM (access)